Digital design and fabrication / Vojin Oklobdzija.

Published
  • Boca Raton, FL : CRC Press c 2008
Physical description
1 online resource (1 volume) : illustrations.
ISBN
  • 9780849386022
  • 0849386020
  • 9780849386046
  • 0849386047
Notes
  • Includes bibliographical references and index.
  • Print version record.
Contents
  • Trends and projections for the future of scaling and future integration trends / Hiroshi Iwai and Shun-ichiro Ohmi -- VLSI circuits / Eugene John -- Pass-transistor CMOS circuits / Shunzo Yamashita -- Synthesis of CMOS pass-transistor logic / Dejan Marković -- Silicon on insulator / Yuichi Kado -- High-speed, low-power emitter coupled logic circuits / Tadahiro Kuroda -- Price-performance of computer technology / John C. McCallum -- Semiconductor memory circuits / Eugene John -- Semiconductor storage devices in computing and consumer applications / Farzin Michael Jahed -- Design of high-speed CMOS PLLs and DLLs / John George Maneatis -- Latches and flip-flops / Fabian Klass -- High-performance embedded SRAM / Cyrus (Morteza) Afghani -- Multiple-valued logic circuits / K. Wayne Current -- FPGAs for rapid prototyping / James O. Hamblen -- Issues in high-frequency processor design / Kevin J. Nowka -- High speed computer arithmetic / Earl E. Swartzlander, Jr. -- Fast adders and multipliers / Gensuke Goto -- Design for low power / Hai Li [and others] -- Low-power circuit technologies / Masayuki Miyazaki -- Techniques for leakage power reduction / Vivek De [and others] -- Dynamic voltage scaling / Thomas D. Burd -- Lightweight embedded systems / Foad Dabiri [and others] -- Low-power design of systems on chip / Christian Piguet -- Implementation-level impact on power-design / Katsunori Seno -- Accurate power estimation of combinational CMOS digital circuits / Hendrawan Soeleman and Kaushik Roy -- Clock- powered CMOS for energy-efficient computing / Nestoras Tzartzanis and William Athas -- System-on-chip (SoC) testing : current practices and challenges for tomorrow / R. Chandramouli -- Test technology for sequential circuits / H.T. Vierhaus and Zoran Stamenković -- Scan testing / Chouki Aktouf -- Computer-aided analysis and forecast of integrated circuit yield / Zoran Stamenković and N. Stojadinović.
Genre
  • Bibliography
  • Electronic books.
  • Illustrated
  • text
Language
  • English

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Live circulation data is not available.

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General Reference Collection, St Pancras Reading Rooms DRT ELD.DS.163688

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